Center for Materials Characterization

 

 Overview

 

Center for Materials Characterization is a well-equipped, central resource facility of the laboratory. The Center offers its expertise to NCL’s research community and also provides assistance to outside research institutions, universities and industries for characterization of materials.

 

Mission & Goals

 

- Structural characterization and compositional analysis of materials of interest to NCL

 

- Maintenance of advanced analytical instrumentation

 

Competency

 

- Single crystal X-ray crystallography of small organic molecules and biomacromolecules

 

- Electron microscopy (scanning and transmission) of soft and hard materials

 

- Surface spectroscopy of catalytic, inorganic and polymer materials

 

- Mass spectrometry of organic and biomolecules

 

- X-ray diffraction of crystalline and semicrystalline materials

 

- Measurement of magnetic properties of materials

 

Facilities

 

Electron Spectroscopy

 

- ESCA3000 system

 

- X-ray source (Twin anode)

 

- X-ray source with monochromator

 

- High pressure gas cell

 

- Cold cathode ion gun (AG 5000)

 

- Ultra violet source (He I and He II)

 

- Ion gun (EX-05) for cleaning the surface

 

- Heating cooling arrangement (500K - 70K)

 

Scanning Electron Microscopy

 

 - Leica Stereoscan 440SEMwith Phoenix EDAX EDXS

 

- Electron gun with tungsten filament

 

- Secondary and back scattered electron detectors

 

- Manual Super - Eucentric stage with 0 - 360 rotational and 0-90 tilt mechanisms

 

- Au-, Pd coating unit for non-conducting samples

 

- Supper Ultra thin sapphire window Si(Li) detector

 

- Standardless quantification software with Z,A,F corrections.

 

Transmission Electron Microscopy

 

- JEOL1200EX TEM

 

- Tungsten electron source

 

- LAB6 electron source

 

- Built-in camera with electron image film

 

Single Crystal X-Ray Diffractometry

 

- D8 3-axis goniometer, K760 X-ray generator, Video camera

 

- Frame buffer PC

 

- OXFORD Cryo System for low temperature studies

 

- Leica Polarizing MicroscopeMZ-75 with CCD

 

- SHELXTL software for data collection, structure solution and refinement

 

- Graphics software for visualizing, plotting and analyzing the structure

 

- The Cambridge Structural Database

 

X-ray Diffractometry

 

 - Philips X’pert Pro PW-3040

 

- Special detector – X’elerator

 

- High temperature (RT to 1500 C)

 

- Low temperature (RT to -190 C)

 

- Accessories for odd size samples

 

- Transmission geometry (capillary)

 

- Thin film samples

 

Raman Spectroscopy

 

- Spectra Physics 165 argon ion laser

 

- Excitations at 514.5 nm, 488nm

 

- Sample device with fore-optics

 

- SPEX 1403 double monochromator coupled to a SPEX 1442 third monochromator

 

- RCA extended response C31034 photomultiplier and photon counting detection

 

- SPEXDM1interactive station for spectrometer control, data collection, data processing and data display

 

- SPEX DM111 for data storage

 

- Bausch & Lomb DMP40 digital plotter

 

Mass Spectroscopy GC-MS

 

- Finnigan MAT 1020BGC-MS

 

- Gas chromatograph

 

- Solid direct inlet probe

 

- Electron impact ionization ion source

 

- Quadrupole mass analyzer

 

Mass Spectroscopy LC-MS

 

- API QSTAR Pulsar hybrid LC- MS quadrupole and TOF based single mass spectrometer

 

- Product ion mass spectrometer

 

Precursor ion mass spectrometer

 

- Ion Spray Ion Source (0.1 µL/min to >1 mL/min)

 

- Turbo Ion Spray Ion Source (40 µL/min to >1 mL/min)

 

- Nano Spray Ion Source (<10 nL/min)

 

- Atmospheric Pressure Chemical Ionization

 

- Source (APCI) (up to 2 mL/min)

 

Magnetic Measurements

 

- EG&GPAR4500 Vibrating Sample Magnetometer

 

- Bipolar power supply for generating field up to 2T

 

- Close cycle cryostat (10-300 K)

 

- Oven (300-1000 K).

 

Electron Spin Resonance Spectroscopy

 

- BRUKER X-band ER 200D-SRC spectrometer

 

- Magnet power supply unit

 

- Microwave bridge

 

- Time base unit, a signal channel and a field controller

 

- Chart recorder

 

- Microwave cavity

 

Mossbauer Spectroscopy

 

- Austin S-600 Mossbauer Spectrometer

 

- Canberra 95 MCA

 

- Mossbauer source : Co , 10 mCi

 

Thermal Measurements

 

- Seiko TG/DTA 32

 

- Temperature Range : 25 C - 1200 C

 

- Heating Rate Range : 0.01 C - 100 C / Min

 

- Weight : 20 mg. (Max), Accuracy : 0.001 mg

 

- DTA Measuring Range : 2.5 mV - 2500 mV

 

- DTG Range : 0.5 mg - 1000 mg / min

 

Glimpses of current research

 

Contact

 

Dr. SR Sainkar

National Chemical Laboratory ,

Dr. Homi Bhabha Road ,

Pune 411 008 India

Email :sainkar@sil.ncl.res.in

Phone :+91-20-2588 2996

Fax :+91-20-2589 2973